Product Details

Wafermap 3 2

WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
Wafermap is a completely free software. You can free download and use it as long as you like.



     

Dialup (56k) 17 m 31 s
ISDN (128k) 07 m 40 s
DSL (512k) 01 m 55 s
Cable (1024k) 58 s
T1 (1484k) 40 s
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