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Wafermap 3 2
WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools ...
KLA-Tencor Impact XP 1.0.0.8
KLA-Tencor's IMPACT XP - Enables Faster Implementation Of Automatic Defect Classification For Accelerated Ramps Of New Processes And Technologies.
IMPACT XP is part of KLA-Tencor's defect reduction ...
IMPACT XP is part of KLA-Tencor's defect reduction ...